Rigaku Showcases Advanced X-ray Metrology Solutions at SEMICON Taiwan 2026
The Rigaku Group will exhibit at “SEMICON Taiwan 2026,” taking place September 2 to 4, 2026, at TaiNEX 1 and 2 in Taipei. SEMICON Taiwan is a leading international exhibition for the semiconductor industry. Taiwan is home to one of the world’s leading semiconductor ecosystems and plays a central role in the manufacturing of advanced […]
Rigaku Speeds Next-Gen Semiconductor Metrology Development
Rigaku Corporation, one of the global solution partners in X-ray analytical systems and a group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; “Rigaku”), announced the expansion of its development of metrology technologies for next-generation semiconductors, leveraging global research environments. As part of this initiative, Rigaku is working with imec, a world-leading semiconductor […]
Onto Innovation Introduces Dragonfly G5 Inspection System
Onto Innovation Inc. on March 16th announced the launch of the Dragonfly G5 system, a fundamentally new inspection and metrology platform delivering best‑in‑class throughput and enhanced sensitivity required to detect defects as small as 150nm and designed to be extensible for the next several generations of process technology inflections across front-end and advanced packaging applications. A leading manufacturer […]
Capvidia Enhances MBD Interoperability with QIF Support in NX Software
Capvidia, a pioneer in Model-Based Definition (MBD) and digital interoperability, announces full integration support for the latest Siemens NX software release. This significant advancement enhances the enablement of Model-Based Characteristics (MBC) via the QIF standard, reinforcing the digital thread from design to quality and manufacturing across OEMs and their global supply chains. With this release, Siemens’ […]