Rigaku Inaugurates XTRAIA MF-3400 to Measure Next-Generation Semiconductors
Rigaku Corporation, a global solution partner in X-ray analytical systems and a group company of Rigaku Holdings Corporation, has launched the XTRAIA MF-3400, an instrument used in semiconductor manufacturing processes to measure the thickness and composition of wafers. The XTRAIA MF-3400 will significantly enhance productivity in the rapidly growing semiconductor market by enabling high-accuracy evaluation […]
Rigaku Launches XTRAIA XD-3300 for Semiconductor Market
Rigaku Corporation, a global solution partner in X-ray metrology systems and a Group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; hereinafter “Rigaku”), has launched full-fledged commercial production of XTRAIA XD-3300, a high-resolution microspot X-ray diffraction system. Against a background of demand for generative AI and data centers, scaling and 3D realization […]
Rigaku Corporation Announces The Acceptance of Order Of XSPA-200 ER Detector
Rigaku Corporation part of the Rigaku Holdings Group, is an X-ray analyzer Global Solutions Partner for Instruments. The company has begun accepting orders for its X-ray seamless pixel array XSPA-200 ER detector. XSPA-200 ER adopts high energy resolution, which can effectively suppress the increase of sample background noise. As a result, the XSPA-200 ER can […]
